7

Advances in TEM Sample Preparation Using a Focused Ion Beam

Year:
2008
Language:
english
File:
PDF, 365 KB
english, 2008
8

Reducing FIB Damage Using Low Energy Ions

Year:
2006
Language:
english
File:
PDF, 94 KB
english, 2006
9

Circumferential FIB Milling for Lift-Out Specimens

Year:
2006
Language:
english
File:
PDF, 341 KB
english, 2006
10

Relative Contrast in Ion and Electron Induced Secondary Electron Images

Year:
2008
Language:
english
File:
PDF, 288 KB
english, 2008
11

30 keV Ga+ FIB Induced X-Rays (FIBIX) of Conductive Materials

Year:
2009
Language:
english
File:
PDF, 1.51 MB
english, 2009
12

Protective Carbon Deposition for Superior FIB Prepared (S)TEM Specimens

Year:
2009
Language:
english
File:
PDF, 582 KB
english, 2009
13

Contrast Mechanisms in Ga+ Ion Induced Secondary Electron Images

Year:
2009
Language:
english
File:
PDF, 282 KB
english, 2009